Measuring the Shape, Stiffness, and Interface Tension of Droplets with the Scanning Ion Conductance Microscope

Author:

Rheinlaender, Johannes; Schaeffer, Tilman E.

Tübinger Autor(en):

Published in:

Acs Nano (2024), Bd. 18, H. 25, S. 16257-16264

Verlagsangabe:

Washington : Amer Chemical Soc

Language:

English

Full text:

ISSN:

1936-0851

DDC Classifikation:

540 - Chemistry and allied sciences
600 - Technology

Dokumentart:

Article

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